This scanner uses a two-stage magnification approach to achieve sub-micron spatial resolution at source to object distance much greater than these allowed in conventional XCT systems. Zeiss’s resolution at a distance, RaaDTM, approach combines the geometric magnification of the X-Ray imaging with a smart system of microscope lenses to further magnify the image. The system is fitted with X0.4, X4, X20, and X40 magnification lens mounted on a barrel mount for rapid change over. This means that the operator can achieve submicron resolution (pixel size ≥ 70 nm or spatial resolution ≥ 0.7 µm) at large working distances, allowing for imaging of larger specimens or small specimens in contained in-situ rings. Importantly, the machine is capable of phase-contrast imaging overcoming an important limitation of convectional absorption-based CT imaging; i.e. low or complete absence of contrast for low Z materials. The latter is particular useful for biomedical imaging, CFRP and polymer imaging applications.


Zeiss 160 kVp Versa 510

‣ 30 -160 kVp
‣ 2048 x 2048 pixel detector
‣ multiple magnification objectives up to 40x
‣ 0.7 µm true spatial resolution
‣ phase-contrast imaging modes


Highfield Campus